Advanced Imaging Technologies for Automatic Optical Inspection and Dimensional Measurement
(MasterClass in Emerging Manufacturing Technologies)

Introduction
Machine vision and the provision of automatic inspection capabilities offers extensive support across a wide array of industries and applications. In today’s landscape, almost every manufacturer involved in any form of production and delivery of goods to the market derives significant benefits from visual inspection of
product quality. The benefits of machine vision are abundant, contributing to improved quality and
productivity, while driving down manufacturing costs.
Participants will be able to gain valuable insights and knowledge on advanced technologies that are
being used in automatic optical inspection and dimensional measurements. The masterclass is designed
specifically based on local industry demand and have been structured into various sessions covering key
elements and techniques required for the development of 2D and 3D automated inspection systems. Through the hands-on experience and the advanced topics covered, including applied optics, lighting
design, imaging and sensing systems, participants will be able to further develop specific competencies needed in developing automated optical inspection systems. This will enable participants to build on existing
capabilities or develop new capabilities in their workplace.
Why This MasterClass
- Learn about the key components involved in machine vision system
- Learn about lighting technologies for machine vision applications
- Simulation and design of optical systems
- Learn about optical technologies for 3D dimensional measurement
- Learn about image processing technologies in defect detection
- Learn from industrial application case studies
Who Should Attend
- CEOs and CTOs, technical leaders, engineering managers, engineering supervisors, product managers
- System designers, design engineers, R&D engineers, application engineers, sales engineers, inspection and vision technicians, new hires from any manufacturing industry sectors
Trainers' profile
Dr Qian Kemao
Dr Li Xiang Leon
Dr Li Xiang Leon is the Section Manager for the Optics and Imaging Systems (OIS) Group with A*STAR òòò½ÍøInstitute of Manufacturing Technology (SIMTech). His research areas include dimensional measurements, defect inspection, interferometry, wavefront sensing, fiber sensor and bioimaging. His research outputs have been applied in sectors of semiconductor, precision engineering, construction and biomedical.
Dr Andrew Alexander Malcolm
Dr Andrew Alexander Malcolm is the Group Manager for the Optics and Imaging Systems (OIS) Group with A*STAR SIMTech. He specialises in image processing, machine vision, precision measurements and CT metrology technology. He has more than 30 years of industrial and R&D experience.
Contact Us
- For technical enquiries, please contact:
Dr LI Xiang Leon,
Email: lixiang@SIMTech.a-star.edu.sg
- For general enquiries, please contact:
Ms Charlotte LIM,
Email: charlotte_lim@SIMTech.a-star.edu.sg
Registration
- Please register for this course through our Course Registration Form for Public Classes.
- For the first question, please select "MasterClasses".
- Applicants will be placed on our waiting list if the course does not have an upcoming scheduled intake.
- Once the next intake is confirmed to commence, SIMTech will contact the applicants to share the class information.
Collaterals
Schedule
Module | Skills Course Reference Number | Next Intake(s)'s Training Period
(Click on the dates to view its schedules) | Registration Status |
| TGS-2024045280 | The next intake's schedule is still in the planning stage. |
Note: SIMTech and ARTC reserve the right to change the class/schedule/course fee or any details about the course without prior notice to the participants.
Announcement:
- From 1 Oct 2023, attendance-taking for SkillsFuture òòò½Íø(SSG)'s funded courses must be done digitally via the Singpass App. More information may be viewed here.




- View the list of MasterClasses and other programmes offered by SIMTech and ARTC.
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